electron microscope and microanalysis simulation software for the SEM and TEM

Electron Flight Simulator

The world's most widely used X-ray analysis
modeling and simulation software

Electron Flight Simulator is a software tool designed to make your job easier. It can help you understand difficult samples, show the best way to run an analysis, and explain your results to others.
With it you can see how the beam penetrates your sample, and where the X-ray signal comes from, for a wide variety of microscope conditions. You can model multiple layers, particles, defects, inclusions, and cross-sections. Any sample chemistry can be modeled.

Key Benefits

Eliminate guesswork
Fine-tune your analysis conditions
Get more accurate results

Examples

Example 1 shows a particle on a 3-layer on substrate sample; electrons and x-rays are modeled

Example 2 shows electron trajectories in a bulk sample; generated and emitted x-rays are overlaid

Example 3 shows a cross-section of a 5-layer semiconductor sample

Example 4 shows an inclusion in a steel sample

Example 5 shows the spectrum of stainless steel generated with Spectrum Simulator

Example 6 shows how tilting the sample affects the interaction volume

Example 7 shows the electron trajectories in multi-color mode; each color change shows a 10% drop in energy

Download the Demo Version

Description	Part Number	Price
Electron Flight Simulator	EFS3.1	$3,000.00

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